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IEC61032 Test Probe B

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Product Name: IEC61032 Test Probe B
Product Model: CX-2B
Product exhibitors: Chuangxin
Product Documentation: No Related Documents

Brief

IEC61032 Test Probe B Detailed Product Description 1.IEC61032 ,IEC60335,IEC60529; 2.jointed IEC test finger; 3.stainless steel made;


IEC61032 Test Probe B  A detailed description of

IEC61032 Test Probe B,IEC60335 Jointed IEC Test Finger

1.Application:

  • This is the “International” test finger required by most IEC, EN and CSA Standards, in addition to many UL Standards. Built in strict accordance to the newest requirements – with integrar palm simulator.
  • This jointed test probe is strictly designed and manufactured according toIEC61032 , IEC60335, IEC60529 and GB/T4208,GB4706.1,GB/T16842 standards.
  • This is the ONLY Finger Probe available with a integral jack in the handle for continuity testing -as mandated by the IEC CB Scheme. Finger is made of chrome plated steel/stainless steel. All parts precision machined.
  • Test Finger Probe is intended to verify protection of persons against access to hazardous parts for an IP1 Code. Also used to verify protection from access with the back of the hand for an IP suffix A code.

2.Technical paremeter:

 

Knurled finger diameter 12mm
Knurler finger length 80mm
Baffle plate diameter 50mm
Baffle plate length 100mm
Baffle thickness 20mm
Reference

IEC60065, IEC 60335-1, IEC 60529, IEC60884-1,

IEC60950, IEC61032, IEC69745-1

 

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