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IEC61032 50N Test Probe B IP20 Probe

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Product Name: IEC61032 50N Test Probe B IP20 Probe
Product Model: CX-2B
Product exhibitors: Chuangxin
Product Documentation: No Related Documents

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IEC61032 50N Test Probe B IP20 Probe


IEC61032 50N Test Probe B IP20 Probe  A detailed description of

IEC61032 50N Test Probe B IP20 Probe


This test probe B is intended to verify the basic protection against access to hazardous parts. It's also used to verify the protection against access with a finger.

 

Conforms to:

This is the "international" test probe required by most IEC, EN and CSA standards, in addition to many UL standards. The Jointed Finger Test is a high-precision probe built in exact accordance with IEC standards such as IEC 60950, IEC 61010, and IEC 61032 and is also used for CSA and UL standards.


Notes:

Both joints shall permit movement in the same plane and the same direction through an angle of 90o with a 0o to +10o tolerance.


Technical Parameters:

Kunrled finger diameter 12mm                                   
Knurled Finger length 80mm
Baffle plate diameter 50mm
Baffle plate length 100mm
Baffle thickness 20mm
 


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