Product name：Probe Kit for IEC 60950

Probe Kit for IEC 60950     
Safety Test Probe Kit  contains the probes necessary for testing to IEC 60950:
Jointed Finger Probe
Unjointed (Rigid) Finger Probe
Test Pin Probe
 Ø50mm Impact Test Ball, 500 grams
elecommunications Access Probe
 
Accessibility probes are used to test the size of openings to ensure that fingers and objects do not have access to hazardous parts in equipment and machinery. All of the probes in the kit are fabricated in the USA. All components are precisely made from stainless steel and Delrin. These materials ensure a long life and satisfactory use due to their high quality and durability.

1. Jointed Finger Probe : Precision probe which follows IEC specifications and meets the latest requirements. The design features a palm simulator to prevent misuse and restricted joint movement, which simulates human finger movement. The probe is manufactured of stainless steel. The handle is made of Delrin®. This model meets CSA, IEC, UL and other industry requirements.

2. Unjointed Finger Probe : Identical to the Jointed Finger Probe except that it is rigid. Used for forceful insertion where the flexibility of the would be a hindrance. The handle is designed with a screw tap for use with a force gauge. Meets CSA, IEC, UL and other industry requirements.

3. Test Pin Probe  A quality probe used to test for accessibility of small objects. Manufactured of durable Delrin® with a stainless steel tip, it is machined with precision to meet industry standards. Meets CSA, IEC, UL and other industry requirements.

4. Impact Test Ball : Specially machined ball to test impact resistance. This is called for in IEC 60950, UL 78 and many other product specifications such as for the automotive industry. The probe is made of chrome plated steel for durability.

5. Telecommunications Access Probe : Found in IEC 60950, UL and CSA standards, it is used to check for limited access to telecommunication voltages (TNV), mainly telephone jacks and operator area