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Product Details
a brief introdction：
Details description：
Product information:
This test probe complies with the requirements of Probe B as specified in IEC 61032 and IEC 60529 IP2X. It features an M6 threaded hole at the end of the handle, allowing it to be connected to a force gauge for precise testing applications.
Technical parameters:
| Parameters /Model | CX-T2B |
| Name | Standard test probe with force |
| Joint 1 | 30±0.2 (mm) |
| Joint 2 | 60±0.2 (mm) |
| Finger length | 80±0.2 (mm) |
| Fingertip to baffle | 180±0.2 (mm) |
| Cylindrical | R2±0.05 (mm) |
| Spherical | S4±0.05 (mm) |
| Fingertip cutting bevel angle | 37o 0 -10’ |
| Fingertip taper | 14 o 0 -10’ |
| Test finger diameter | Ф12 0 -0.05 (mm) |
| A-A Section diameter | Ф50(mm) |
| A-A Section width | 20±0.2 |
| Baffle diameter | Ф75±0.2(mm) |
| Baffle thickness | 5±0.5(mm) |
| Built-in Force | 0-10N force, resolution of 1N |
