Product Details
  • Product name:IEC 62368-1 V.1-V.2-V.3-V.4-V.5 Test Probe

  • Product number:
  • Product manufacturer:Chuangxin
  • Product documentation:
你添加了1件商品 查看购物车
a brief introdction:
Figure V.1 – Jointed test probe for equipment likely to be accessible to children Figure V.2 – Jointed test probe for equipment not likely to be accessible to children Figure V.3 – Blunt probe Figure V.4 – Wedge probe Figure V.5 – Terminal probe
Details description:

IEC 62368-1 Figure V.1 – Jointed test probe for equipment likely to be accessible to children

Product Information:
The Jointed Test Probe is designed and manufactured according to the standard requirements of IEC62368-1 Clause 4.8,5.3.2, 8.5.4.3 Figure V.1, UL474 Fig 5.1, UL507 Fig 9.2(PA100A), UL982 Fig 7.1, UL1017 Fig 2, UL1062 Fig1.2, UL1278Fig 8.3, UL1310 Fig 16.2, UL6500 Fig14, UL60065 Fig14 and UL60950 Fig NAF.1 and etc. It is used in the enclosure protection test of the electrical equipment.
Test sample: Easily accessible enclosure live parts or mechanical parts.
Feature: Nylon handle + stainless steel probe, it is manufactured according to the standard figure (but jointed version).
The force is achieved by working with a force gauge, there is a M6 thread hole on the handle of probe which can match a force gauge.

Technical Parameters:

Applied standards IEC62368-1
Clause 4.8 Figure V.1 (but jointed version)
Probe material Stainless steel
Handle material Nylon
Applied force Without built-in force, should work with a force gauge
Application Electrical equipment

 

 

 

IEC62368-1 Clause 4.8 Figure V.1 Jointed Test Probe For Equipment 0



IEC 62368-1  Stainless Steel Blunt Test Probe Of Figure V.3

 

Product information:

The blunt probe of figure V.3 conforms to IEC 62368-1:2018 clause 5.3.2, 5.4.10, V.1.4 and figure V.3, IEC60950 figure 2C, IEC60065 figure B1, IEC62151 figure 3 and UL6500 figure B.1.

It is used for the bare parts of TNV circuits of information technology equipment to see whether they have sufficient protection.

 

Technical Parameters:

Probe Length 80 mm
Probe End Radius R6 mm
Probe Diameter Φ12 mm
Baffle Diameter of Handle Φ 50 mm
Probe material Stainless steel
Handle material Nylon

 

IEC 62368-1 R6mm Stainless Steel Blunt Test Probe Of Figure V.3 0



IEC 62368-1 2018 Clause 5.3.2, V.1.5 Figure V.4 Stainless Steel Wedge Probe

 

Product Information:

 

The wedge-shaped probe complies with IEC 62368-1: 2018 articles 5.3.2, 8.5.4.3, V.1.5 and Figure V.4, IEC 60950-1 Figure naif2 (S5366) and Naf3 (S5370), BS 60950.1108 / 260 / CD and other standard requirements.

Used to test whether the slot can be touched by a person. The test sample includes information technology equipment.

 

Technical Parameters:

 

Applied standard

IEC 62368-1

Applied clause

5.3.2, V.1.5 and figure V.4

Probe material

Stainless steel

Applied Specimen

Document/media Shredders

 

Part of Dimension:

 

The thickness of the probe varies linearly, with slope changes at the following points along the probe:

Distance from probe tip, mm

Probe thickness, mm

0

2

12

4

180

24

 

IEC 62368-1 2018 Clause 5.3.2, V.1.5 Figure V.4 Stainless Steel Wedge Probe 0



粤公网安备 44030602001691号