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IEC Jointed Finger Probe B

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Product Name: IEC Jointed Finger Probe B
Product Model: CX-2B
Product exhibitors: Chuangxin
Product Documentation: No Related Documents

Brief

IEC Jointed Finger Probe B


IEC Jointed Finger Probe B  A detailed description of

IEC Jointed Finger Probe B

 

key words: jointed finger probe,  jointed probe,  Iec Jointed Probe


 This jointed finger probe is intended to verify the basic protection against access to hazardous parts. It's also used to verify the protection against access with a finger.

 

Conforms to:

 

This is the "international" test finger B required by most IEC, EN and CSA standards, in addition to many UL standards. The Jointed Finger Test is a high-precision probe built in exact accordance with IEC standards such as IEC 60950, IEC 61010, and IEC 61032 and is also used for CSA and UL standards.

 

Notes:

Both joints shall permit movement in the same plane and the same direction through an angle of 90o with a 0o to +10o tolerance.

 

Technical Parameters:

Kunrled finger diameter 12mm                                   
Knurled Finger length 80mm
Baffle plate diameter 50mm
Baffle plate length 100mm
Baffle thickness 20mm

 

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